Compensating electrostatic forces by single-scan Kelvin probe force microscopy - Research Collection

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Author

Ziegler, Dominik

Naujoks, Nicola

Stemmer, Andreas

Date

2007

Type

Journal Article

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1088/0957-4484/18/22/225505

Journal / series

Nanotechnology

Volume

18(22)

Pages / Article No.

225505

Publisher

Institute of Physics

Organisational unit

03444 - Stemmer, Andreas / Stemmer, Andreas

Notes

Received 26 March 2007, Published 8 May 2007.

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ETH Bibliography

yes

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