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dc.contributor.author
Schwyter, E. S.
dc.contributor.author
Helbling, T.
dc.contributor.author
Glatz, W.
dc.contributor.author
Hierold, C.
dc.date.accessioned
2017-06-10T08:08:32Z
dc.date.available
2017-06-10T08:08:32Z
dc.date.issued
2012-07
dc.identifier.issn
0034-6748
dc.identifier.issn
1089-7623
dc.identifier.other
10.1063/1.4737880
dc.identifier.uri
http://hdl.handle.net/20.500.11850/54613
dc.language.iso
en
dc.publisher
American Institute of Physics
dc.title
Fully automated measurement setup for non-destructive characterization of thermoelectric materials near room temperature
dc.type
Journal Article
ethz.journal.title
Review of Scientific Instruments
ethz.journal.volume
83
ethz.journal.issue
7
ethz.journal.abbreviated
Rev Sci Instrum
ethz.pages.start
074904
ethz.size
11 p.
ethz.notes
Received 23 March 2012, Accepted 5 July 2012, Published online 26 July 2012.
ethz.identifier.wos
ethz.identifier.nebis
000025185
ethz.publication.place
New York
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03609 - Hierold, Christofer / Hierold, Christofer
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03609 - Hierold, Christofer / Hierold, Christofer
ethz.date.deposited
2017-06-10T08:11:39Z
ethz.source
ECIT
ethz.identifier.importid
imp59364facb53f646938
ethz.ecitpid
pub:88165
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-19T01:33:50Z
ethz.rosetta.lastUpdated
2018-10-01T18:06:26Z
ethz.rosetta.versionExported
true
ethz.COinS
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