Monte Carlo simulation and measurement of nanoscale n-MOSFETs - Research Collection

Metadata only

Author

Bufler, F.M.

Asahi, Y.

Yoshimura, H.

Zechner, C.

Schenk, A.

Fichtner, W.

Date

2003-02

Type

Journal Article

Citations

Cited 28 times in Web of Science

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1109/TED.2002.808420

Journal / series

IEEE Transactions on Electron Devices

Volume

50(2)

Pages / Article No.

418 - 424

Publisher

IEEE

Subject

Comparison measurement/simulation; Monte Carlo simulation; Nanoscale MOSFETs; Semiconductor device modeling

Notes

Published online 29 April 2003.

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Citations

Cited 28 times in Web of Science

ETH Bibliography

yes

Altmetrics