Design and Realization of a Fault-Tolerant 90nm CMOS Cryptographic Engine Capable of Performing under Massive Defect Density
Publication status
publishedJournal / series
Proceedings of the 2007 ACM Great Lakes Symposium on VLSIPages / Article No.
Publisher
Association for Computing MachineryEvent
Subject
Fault-tolerant architecture; High defect density; Reliability of submicron and nanoelectronic systemsMore
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ETH Bibliography
yes
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