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dc.contributor.author
Eusgeld, Irene
dc.contributor.author
Echtle, Klaus
dc.contributor.author
Kochs, Hans-Dieter
dc.contributor.author
Limbourg, Philipp
dc.date.accessioned
2017-06-10T10:30:43Z
dc.date.available
2017-06-10T10:30:43Z
dc.date.issued
2007
dc.identifier.isbn
978-1-4244-0607-4
dc.identifier.uri
http://hdl.handle.net/20.500.11850/57780
dc.language.iso
en
dc.publisher
IEEE
dc.subject
Nano
dc.subject
Reliability
dc.subject
System design
dc.subject
Fault-tolerance
dc.subject
Genetic algorithms
dc.title
Automatic Design of Reliable Systems Consisting of Nano-Elements
dc.type
Other Conference Item
ethz.book.title
2007 7TH , VOL 1-3
ethz.journal.title
2007 7TH IEEE CONFERENCE ON NANOTECHNOLOGY, VOL 1-3
ethz.pages.start
595
ethz.pages.end
600
ethz.event
7th IEEE Conference on Nanotechnology
ethz.event.location
Hong Kong, China
ethz.event.date
August 02-05, 2007
ethz.notes
.
ethz.identifier.wos
ethz.publication.place
New York, NY, USA
ethz.publication.status
published
ethz.date.deposited
2017-06-10T10:32:22Z
ethz.source
ECIT
ethz.identifier.importid
imp59364fed5388866727
ethz.ecitpid
pub:92442
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T16:37:23Z
ethz.rosetta.lastUpdated
2017-07-12T16:37:23Z
ethz.rosetta.versionExported
true
ethz.COinS
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