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dc.contributor.author
Niklaus, Pascal
dc.contributor.author
Bonetti, Reto
dc.contributor.author
Stäger, Christof
dc.contributor.author
Kolar, Johann W.
dc.contributor.author
Bortis, Dominik
dc.date.accessioned
2022-10-31T10:35:46Z
dc.date.available
2022-10-31T04:21:29Z
dc.date.available
2022-10-31T10:35:46Z
dc.date.issued
2022
dc.identifier.issn
2644-1314
dc.identifier.other
10.1109/OJPEL.2022.3208693
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/578478
dc.identifier.doi
10.3929/ethz-b-000578478
dc.description.abstract
Galvanically isolated voltage measurements are becoming increasingly important for the characterization of converter systems with fast switching Wide-Bandgap (WBG) semiconductors. A very high Common Mode Rejection Ratio (CMRR) > 80dB for frequencies up to several tens of MHz is required to accurately measure, e.g., the high-side gate-source or drain-source voltage in a half-bridge, or voltages on floating potentials as, e.g., found in multi-level converters. Common to all listed measurement scenarios is the fast changing reference potential, which acts as Common Mode (CM) disturbance. This article derives the minimum necessary CMRR at different frequencies to constrain the time-domain measurement error below a certain limit. Thereby, only the switched voltage and the voltage transition rate (dv/dt) of the CM disturbance have to be considered and not the actual converter switching frequency f(sw). Afterwards, a galvanically isolated measurement system with a CMRR > 100 dB up to 100 MHz and an analog measurement bandwidth of 130 MHz is presented. Critical design aspects to achieve this performance are investigated. Compared to commercially available isolated voltage probes, the presented measurement system does not require any additional equipment like an oscilloscope to perform and visualize measurements, since the data is already digitized/sampled and thus can be transmitted directly to a host device (e.g., computer or monitoring system) with corresponding Graphical User Interface (GUI) software. Experimental verification in frequency- and time-domain confirms that the performance is on par with the best commercially available isolated voltage probes.
en_US
dc.format
application/pdf
en_US
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.rights.uri
http://creativecommons.org/licenses/by/4.0/
dc.subject
Gate drivers
en_US
dc.subject
Isolation technology
en_US
dc.subject
Measurement techniques
en_US
dc.subject
Power semiconductor switches
en_US
dc.subject
Power system measurements
en_US
dc.subject
Voltage measurement
en_US
dc.title
High-Bandwidth Isolated Voltage Measurements With Very High Common Mode Rejection Ratio for WBG Power Converters
en_US
dc.type
Journal Article
dc.rights.license
Creative Commons Attribution 4.0 International
dc.date.published
2022-09-22
ethz.journal.title
IEEE Open Journal of Power Electronics
ethz.journal.volume
3
en_US
ethz.pages.start
651
en_US
ethz.pages.end
664
en_US
ethz.version.deposit
publishedVersion
en_US
ethz.identifier.wos
ethz.publication.place
New York, NY
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03573 - Kolar, Johann W. / Kolar, Johann W.
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03573 - Kolar, Johann W. / Kolar, Johann W.
ethz.date.deposited
2022-10-31T04:21:36Z
ethz.source
WOS
ethz.eth
yes
en_US
ethz.availability
Open access
en_US
ethz.rosetta.installDate
2022-10-31T10:35:48Z
ethz.rosetta.lastUpdated
2023-02-07T07:24:55Z
ethz.rosetta.versionExported
true
ethz.COinS
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