Thickness Determination of Subnanometer Layers Using Laser Ablation Inductively Coupled Plasma Mass Spectrometry
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Date
2012-10Type
- Journal Article
ETH Bibliography
yes
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Publication status
publishedExternal links
Journal / series
Analytical ChemistryVolume
Pages / Article No.
Publisher
American Chemical SocietyOrganisational unit
03512 - Günther, Detlef / Günther, Detlef
Notes
Received 26 July 2012, Accepted 17 September 2012.More
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ETH Bibliography
yes
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