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dc.contributor.author
Luisier, Mathieu
dc.date.accessioned
2017-06-10T12:33:31Z
dc.date.available
2017-06-10T12:33:31Z
dc.date.issued
2012
dc.identifier.isbn
978-1-4673-4870-6
dc.identifier.other
10.1109/IEDM.2012.6479057
dc.identifier.uri
http://hdl.handle.net/20.500.11850/61531
dc.language.iso
en
dc.publisher
IEEE
dc.title
Towards atomistic simulations of the electro-thermal properties of nanowire transistors
dc.type
Conference Paper
ethz.book.title
IEEE International Electron Devices Meeting (IEDM)
ethz.pages.start
17.1.1
ethz.pages.end
17.1.1
ethz.event
2012 IEEE International Electron Devices Meeting
ethz.event.location
San Francisco, CA, USA
ethz.event.date
December 10-12, 2012
ethz.identifier.wos
ethz.publication.place
Piscataway, N.J.
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03925 - Luisier, Mathieu / Luisier, Mathieu
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03925 - Luisier, Mathieu / Luisier, Mathieu
ethz.date.deposited
2017-06-10T12:33:44Z
ethz.source
ECIT
ethz.identifier.importid
imp593650364a70c71998
ethz.ecitpid
pub:97996
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-17T09:07:11Z
ethz.rosetta.lastUpdated
2018-11-02T07:41:42Z
ethz.rosetta.versionExported
true
ethz.COinS
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