Multiple multipole program analysis of metallic optical waveguides - Research Collection

Metadata only

Author

Hafner, Christian

Bertolace, Andre

Vahldieck, Rüdiger

Date

2007

Type

Conference Paper

Citations

Cited 2 times in Web of Science

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1117/12.725870

Book title

Modeling aspects in optical metrology : 18-19 June 2007, Munich, Germany

Journal / series

Proceedings of the Society of Photo-Optical Instrumentation Engineers

Volume

6617

Pages / Article No.

66170C

Publisher

SPIE

Event

Modeling Aspects in Optical Metrology, Munich, Germany, June 18-19, 2007

Organisational unit

03472 - Professur für Feldtheorie (ehemalig)

Notes

Online Publication Date: 18 June 2007.

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Citations

Cited 2 times in Web of Science

ETH Bibliography

yes

Altmetrics