Show simple item record

dc.contributor.author
Hoffmann, Johannes Paul
dc.contributor.author
Leuchtmann, Pascal
dc.contributor.author
Vahldieck, Rüdiger
dc.date.accessioned
2020-09-21T08:42:28Z
dc.date.available
2017-06-08T17:18:38Z
dc.date.available
2020-09-21T08:42:28Z
dc.date.issued
2007
dc.identifier.isbn
978-2-87487-001-9
en_US
dc.identifier.other
10.1109/EUMC.2007.4405208
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/6207
dc.description.abstract
This paper presents a detailed investigation of the influence of pin gap size on the S-parameters of the 1.85 mm connector. In contrast to earlier publications connector geometry is simulated with all chamfers, gaps and contact fingers. Simulation results are verified by cross-checking between finite element frequency domain and finite difference time domain methods. Based on reliable simulation results, a very fast tool was developed to calculate S-parameters for a given connector geometry. This was done using database and interpolation techniques. The most important result is that very small pin gaps in conjunction with large chamfers have a drastic impact on connector S-parameters for frequencies above 50 GHz.
en_US
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.subject
Coaxial connectors
en_US
dc.subject
FDTD methods
en_US
dc.subject
electromagnetic analysis
en_US
dc.subject
finite element methods
en_US
dc.title
Pin gap investigations for the 1.85mm coaxial connector
en_US
dc.type
Conference Paper
dc.date.published
2007-12-17
ethz.book.title
2007 European Microwave Conference
en_US
ethz.journal.volume
1
en_US
ethz.pages.start
388
en_US
ethz.pages.end
391
en_US
ethz.event
37th European Microwave Conference (EuMC 2007)
en_US
ethz.event.location
Munich, Germany
en_US
ethz.event.date
October 9-12, 2007
en_US
ethz.publication.place
Piscataway, NJ
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02140 - Departement Informationstechnologie und Elektrotechnik / Department of Information Technology and Electrical Engineering::02635 - Institut für Elektromagnetische Felder (IEF) / Electromagnetic Fields Laboratory (IEF)::03472 - Professur für Feldtheorie (ehemalig)
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02140 - Departement Informationstechnologie und Elektrotechnik / Department of Information Technology and Electrical Engineering::02635 - Institut für Elektromagnetische Felder (IEF) / Electromagnetic Fields Laboratory (IEF)::03472 - Professur für Feldtheorie (ehemalig)
ethz.date.deposited
2017-06-08T17:19:03Z
ethz.source
ECIT
ethz.identifier.importid
imp59364b9ccb88a12584
ethz.ecitpid
pub:16587
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2017-07-25T18:33:38Z
ethz.rosetta.lastUpdated
2022-03-29T03:10:56Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=Pin%20gap%20investigations%20for%20the%201.85mm%20coaxial%20connector&rft.date=2007&rft.volume=1&rft.spage=388&rft.epage=391&rft.au=Hoffmann,%20Johannes%20Paul&Leuchtmann,%20Pascal&Vahldieck,%20R%C3%BCdiger&rft.isbn=978-2-87487-001-9&rft.genre=proceeding&rft_id=info:doi/10.1109/EUMC.2007.4405208&rft.btitle=2007%20European%20Microwave%20Conference
 Search print copy at ETH Library

Files in this item

FilesSizeFormatOpen in viewer

There are no files associated with this item.

Publication type

Show simple item record