A calibration algorithm for nearfield scanning microwave microscopes

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Autor(in)

Datum

2012

Typ

Conference Paper

ETH Bibliographie

yes

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Publikationsstatus

published

Externe Links

Zeitschrift / Serie

Proceedings of the 12th IEEE Conference on Nanotechnology (IEEE-NANO 2012)

Verlag

IEEE

Konferenz

12th IEEE Conference on Nanotechnology (IEEE-NANO 2012), Birmingham, UK, August 20-23, 2012

Organisationseinheit

03472 - Professur für Feldtheorie (ehemalig)

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ETH Bibliographie

yes

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