A calibration algorithm for nearfield scanning microwave microscopes

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Author

Date

2012

Type

Conference Paper

ETH Bibliography

yes

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Publication status

published

External links

Journal / series

Proceedings of the 12th IEEE Conference on Nanotechnology (IEEE-NANO 2012)

Publisher

IEEE

Event

12th IEEE Conference on Nanotechnology (IEEE-NANO 2012), Birmingham, United Kingdom, August 20-23, 2012

Organisational unit

03472 - Professur für Feldtheorie (ehemalig)

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ETH Bibliography

yes

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Research Collection