Mechanism of near-field Raman enhancement in two-dimensional systems
dc.contributor.author
Maximiano, Rodolfo V.
dc.contributor.author
Beams, Ryan
dc.contributor.author
Novotny, Lukas
dc.contributor.author
Jorio, Ado
dc.contributor.author
Cançado, Luiz Gustavo
dc.date.accessioned
2017-06-10T13:06:34Z
dc.date.available
2017-06-10T13:06:34Z
dc.date.issued
2012-06
dc.identifier.issn
1098-0121
dc.identifier.issn
0163-1829
dc.identifier.issn
1550-235X
dc.identifier.issn
0556-2805
dc.identifier.issn
2469-9969
dc.identifier.issn
1095-3795
dc.identifier.issn
2469-9950
dc.identifier.other
10.1103/PhysRevB.85.235434
dc.identifier.uri
http://hdl.handle.net/20.500.11850/62323
dc.language.iso
en
dc.publisher
American Physical Society
dc.title
Mechanism of near-field Raman enhancement in two-dimensional systems
dc.type
Journal Article
ethz.journal.title
Physical Review B
ethz.journal.volume
85
ethz.journal.issue
23
ethz.journal.abbreviated
Phys. Rev., B
ethz.pages.start
235434
ethz.size
8 p.
ethz.notes
Received 1 March 2012, Revised 25 May 2012, Published 18 June 2012.
ethz.identifier.nebis
001888782
ethz.publication.place
Ridge, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03944 - Novotny, Lukas / Novotny, Lukas
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03944 - Novotny, Lukas / Novotny, Lukas
ethz.date.deposited
2017-06-10T13:08:46Z
ethz.source
ECIT
ethz.identifier.importid
imp59365042eb60838276
ethz.ecitpid
pub:99003
ethz.eth
no
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-18T08:33:42Z
ethz.rosetta.lastUpdated
2022-03-28T11:25:56Z
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Journal Article [122033]