Editorial

Metadata only

Author

Date

2012

Type

Other Journal Item

ETH Bibliography

yes

Altmetrics

Publication status

published

External links

Journal / series

Microelectronics Reliability

Volume

52(9-10)

Pages / Article No.

1751 - 1752

Publisher

Elsevier

Event

23rd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis, Cagliari, Italy, October 1-5, 2012

Organisational unit

03380 - Huang, Qiuting (emeritus) / Huang, Qiuting (emeritus)

Notes

Available online 23 September 2012.

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ETH Bibliography

yes

Altmetrics

Research Collection