On the exploitation of the inherent error resilience of wireless systems under unreliable silicon

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Author

Date

2012

Type

Conference Paper

ETH Bibliography

yes

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Publication status

published

Pages / Article No.

510 - 515

Publisher

IEEE

Event

49th ACM/EDAC/IEEE Design Automation Conference (DAC 2012), San Francisco, CA, June 3-7, June 2012

Organisational unit

03380 - Huang, Qiuting (emeritus) / Huang, Qiuting (emeritus)

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ETH Bibliography

yes

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Research Collection