An Ultra-Low-Power Serial Implementation for Sigmoid and Tanh Using CORDIC Algorithm
dc.contributor.author
Chang, Yaoxing
dc.contributor.author
Jokic, Petar
dc.contributor.author
Emery, Stephane
dc.contributor.author
Benini, Luca
dc.date.accessioned
2023-09-06T12:31:44Z
dc.date.available
2023-08-19T03:59:39Z
dc.date.available
2023-09-06T12:31:44Z
dc.date.issued
2023
dc.identifier.isbn
979-8-3503-9624-9
en_US
dc.identifier.other
10.23919/DATE56975.2023.10136960
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/627331
dc.description.abstract
Activation functions (AFs) such as sigmoid and tanh play an important role in neural networks (NNs). Their efficient implementation is critical for always-on edge devices. In this work, we propose a serial-arithmetic architecture for AFs in edge audio applications using the CORDIC algorithm. The design enables to dynamically trade-off throughput/latency and accuracy, and pos-sesses higher area and power efficiency compared to conventional methods such as look-up table (LUT) and piece-wise linear (PWL)-based methods. Considering the throughput difference among the designs, we evaluate average power consumption taking into account active and idle working cycles for same applications. Synthesis results in a 22nm process show that our CORDIC-based design has an area of 545.77 μm2 and an average power of 0.69 μW for a keyword spotting task, achieving a reduction of 36.92% and 71.72% in average power consumption compared to LUT and PWL-based implementations, respectively.
en_US
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.subject
CORDIC
en_US
dc.subject
edgeML
en_US
dc.subject
Sigmoid
en_US
dc.subject
Tanh
en_US
dc.subject
serial architecture
en_US
dc.title
An Ultra-Low-Power Serial Implementation for Sigmoid and Tanh Using CORDIC Algorithm
en_US
dc.type
Conference Paper
dc.date.published
2023-06-02
ethz.book.title
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)
en_US
ethz.pages.start
10136960
en_US
ethz.size
2 p.
en_US
ethz.event
26th Design, Automation and Test in Europe Conference and Exhibition (DATE 2023)
en_US
ethz.event.location
Antwerp, Belgium
en_US
ethz.event.date
April 17-19, 2023
en_US
ethz.identifier.wos
ethz.publication.place
Piscataway, NJ
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03996 - Benini, Luca / Benini, Luca
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03996 - Benini, Luca / Benini, Luca
ethz.date.deposited
2023-08-19T03:59:49Z
ethz.source
WOS
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2023-09-06T12:31:45Z
ethz.rosetta.lastUpdated
2024-02-03T03:19:55Z
ethz.rosetta.versionExported
true
ethz.COinS
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