Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework
dc.contributor.author
Woehrle, Matthias
dc.contributor.author
Plessl, Christian
dc.contributor.author
Beutel, Jan
dc.contributor.author
Thiele, Lothar
dc.contributor.editor
Sreenan, Cormac J.
dc.date.accessioned
2017-06-08T17:21:23Z
dc.date.available
2017-06-08T17:21:23Z
dc.date.issued
2007
dc.identifier.isbn
978-1-59593-694-3
dc.identifier.uri
http://hdl.handle.net/20.500.11850/6342
dc.language.iso
en
dc.publisher
Association for Computing Machinery
dc.subject
wireless sensor networks
dc.subject
testing
dc.subject
reliability
dc.title
Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework
dc.type
Conference Paper
ethz.book.title
Proceedings of the 4th workshop on Embedded networked sensors
ethz.pages.start
93
ethz.pages.end
97
ethz.event
Fourth Workshop on Embedded Networked Sensors (EmNets 2007)
ethz.event.location
Cork, Ireland
ethz.event.date
June 25-26, 2007
ethz.publication.place
New York, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02640 - Inst. f. Technische Informatik und Komm. / Computer Eng. and Networks Lab.::03429 - Thiele, Lothar (emeritus) / Thiele, Lothar (emeritus)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02640 - Inst. f. Technische Informatik und Komm. / Computer Eng. and Networks Lab.::03429 - Thiele, Lothar (emeritus) / Thiele, Lothar (emeritus)
ethz.date.deposited
2017-06-08T17:21:38Z
ethz.source
ECIT
ethz.identifier.importid
imp59364b9f7d3e813944
ethz.ecitpid
pub:16735
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T17:29:13Z
ethz.rosetta.lastUpdated
2024-02-01T14:29:32Z
ethz.rosetta.versionExported
true
ethz.COinS
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Conference Paper [35277]