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dc.contributor.author
Woehrle, Matthias
dc.contributor.author
Plessl, Christian
dc.contributor.author
Beutel, Jan
dc.contributor.author
Thiele, Lothar
dc.contributor.editor
Sreenan, Cormac J.
dc.date.accessioned
2017-06-08T17:21:27Z
dc.date.available
2017-06-08T17:21:27Z
dc.date.issued
2007
dc.identifier.isbn
1-59593-694-7
dc.identifier.isbn
978-1-59593-694-3
dc.identifier.other
10.1145/1278972.1278996
dc.identifier.uri
http://hdl.handle.net/20.500.11850/6362
dc.language.iso
en
dc.publisher
ACM Press
dc.subject
wireless sensor networks
dc.subject
testing
dc.subject
reliability
dc.title
Increasing the reliability of wireless sensor networks with a distributed testing framework
dc.type
Conference Proceedings
ethz.book.title
Proceedings of the 4th Workshop on Embedded Networked Sensors
ethz.pages.start
93
ethz.pages.end
97
ethz.event
4th Workshop on Embedded Networked Sensors
ethz.event.date
June 25-26, 2007
ethz.publication.place
New York, N.Y.
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02640 - Inst. f. Technische Informatik und Komm. / Computer Eng. and Networks Lab.::03429 - Thiele, Lothar (emeritus) / Thiele, Lothar (emeritus)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02640 - Inst. f. Technische Informatik und Komm. / Computer Eng. and Networks Lab.::03429 - Thiele, Lothar (emeritus) / Thiele, Lothar (emeritus)
ethz.date.deposited
2017-06-08T17:21:38Z
ethz.source
ECIT
ethz.identifier.importid
imp59364b9fc9fe523858
ethz.ecitpid
pub:16757
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-13T00:16:18Z
ethz.rosetta.lastUpdated
2018-10-01T04:46:20Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
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