X-ray grating interferometry for imaging and metrology

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Author
Rutishauser, Simon
Date
2013
Type
    Doctoral Thesis
Rights / license
In Copyright - Non-Commercial Use Permitted
Permanent link
https://doi.org/10.3929/ethz-a-009753051
Publication status
published
External links
Search print copy at ETH Library
Contributors
Examiner: Stampanoni, Marco
Examiner: David, Christian
Publisher
ETH Zurich
Subject
GONIOMETRIC METHODS (X-RAY CRYSTALLOGRAPHY); DIFFRACTION GRATINGS, PLANE-WAVE DIFFRACTION (OPTICS); INTERFEROMETRIC INSTRUMENTS (OPTICAL INSTRUMENTS); BRAGGSCHES GESETZ, RÖNTGENOPTIK (KRISTALLOGRAPHIE); RÖNTGENGONIOMETERVERFAHREN (KRISTALLOGRAPHIE); BEUGUNGSGITTER, EBENE WELLEN (OPTIK); INTERFEROMETRISCHE GERÄTE (OPTISCHE INSTRUMENTE); BRAGG'S LAW, X-RAY OPTICS (CRYSTALLOGRAPHY)
Organisational unit
02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.
03817 - Stampanoni, Marco F.M. / Stampanoni, Marco F.M.  
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