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dc.contributor.author
Rutishauser, Simon
dc.contributor.supervisor
Stampanoni, Marco
dc.contributor.supervisor
David, Christian
dc.date.accessioned
2017-08-03T07:30:29Z
dc.date.available
2017-06-10T15:41:51Z
dc.date.available
2017-08-03T07:30:29Z
dc.date.issued
2013
dc.identifier.uri
http://hdl.handle.net/20.500.11850/65481
dc.identifier.doi
10.3929/ethz-a-009753051
dc.format
application/pdf
dc.language.iso
en
en_US
dc.publisher
ETH
en_US
dc.rights.uri
http://rightsstatements.org/page/InC-NC/1.0/
dc.subject
GONIOMETRIC METHODS (X-RAY CRYSTALLOGRAPHY)
en_US
dc.subject
DIFFRACTION GRATINGS, PLANE-WAVE DIFFRACTION (OPTICS)
en_US
dc.subject
INTERFEROMETRIC INSTRUMENTS (OPTICAL INSTRUMENTS)
en_US
dc.subject
BRAGGSCHES GESETZ, RÖNTGENOPTIK (KRISTALLOGRAPHIE)
en_US
dc.subject
RÖNTGENGONIOMETERVERFAHREN (KRISTALLOGRAPHIE)
en_US
dc.subject
BEUGUNGSGITTER, EBENE WELLEN (OPTIK)
en_US
dc.subject
INTERFEROMETRISCHE GERÄTE (OPTISCHE INSTRUMENTE)
en_US
dc.subject
BRAGG'S LAW, X-RAY OPTICS (CRYSTALLOGRAPHY)
en_US
dc.title
X-ray grating interferometry for imaging and metrology
en_US
dc.type
Doctoral Thesis
dc.rights.license
In Copyright - Non-Commercial Use Permitted
dc.date.published
2012
ethz.size
1 Band
en_US
ethz.code.ddc
DDC - DDC::5 - Science::530 - Physics
en_US
ethz.identifier.diss
20939
en_US
ethz.identifier.nebis
009753051
ethz.publication.place
Zürich
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02631 - Institut für Biomedizinische Technik / Institute for Biomedical Engineering::03817 - Stampanoni, Marco F.M. / Stampanoni, Marco F.M.
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02631 - Institut für Biomedizinische Technik / Institute for Biomedical Engineering::03817 - Stampanoni, Marco F.M. / Stampanoni, Marco F.M.
ethz.date.deposited
2017-06-10T15:41:54Z
ethz.source
ECOL
ethz.source
ECIT
ethz.identifier.importid
imp5936507d0a49998321
ethz.identifier.importid
imp59366b3a5657040856
ethz.ecolpid
eth:6750
ethz.ecitpid
pub:104277
ethz.eth
yes
en_US
ethz.availability
Open access
en_US
ethz.rosetta.installDate
2017-07-19T06:13:54Z
ethz.rosetta.lastUpdated
2020-02-15T06:32:11Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=X-ray%20grating%20interferometry%20for%20imaging%20and%20metrology&rft.date=2013&rft.au=Rutishauser,%20Simon&rft.genre=unknown&rft.btitle=X-ray%20grating%20interferometry%20for%20imaging%20and%20metrology
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