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dc.contributor.author
Lahourcade, Lise
dc.contributor.author
Coronel, Naomi C.
dc.contributor.author
Delaney, Kris T.
dc.contributor.author
Shukla, Sujeet K.
dc.contributor.author
Spaldin, Nicola
dc.contributor.author
Atwater, Harry A.
dc.date.accessioned
2017-06-10T15:45:15Z
dc.date.available
2017-06-10T15:45:15Z
dc.date.issued
2013-05
dc.identifier.issn
0935-9648
dc.identifier.issn
1521-4095
dc.identifier.other
10.1002/adma.201204718
dc.identifier.uri
http://hdl.handle.net/20.500.11850/65509
dc.language.iso
en
dc.publisher
Wiley-VCH
dc.subject
Energy materials
dc.subject
Materials science
dc.subject
Semiconductors
dc.subject
Thin films
dc.title
Structural and Optoelectronic Characterization of RF Sputtered ZnSnN2
dc.type
Journal Article
ethz.journal.title
Advanced Materials
ethz.journal.volume
25
ethz.journal.issue
18
ethz.journal.abbreviated
Adv Mater
ethz.pages.start
2562
ethz.pages.end
2566
ethz.notes
Manuscript received 15 November 2012, Manuscript revised 6 December 2012, Article first published online 6 February 2013, Issue published online May 2013.
ethz.identifier.wos
ethz.identifier.nebis
000504408
ethz.publication.place
Weinheim
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::03903 - Spaldin, Nicola A. / Spaldin, Nicola A.
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::03903 - Spaldin, Nicola A. / Spaldin, Nicola A.
ethz.date.deposited
2017-06-10T15:47:47Z
ethz.source
ECIT
ethz.identifier.importid
imp5936507d4be7e34751
ethz.ecitpid
pub:104305
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-15T15:17:44Z
ethz.rosetta.lastUpdated
2021-02-14T10:13:06Z
ethz.rosetta.versionExported
true
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