Imaging impurities in semiconductor nanostructures
Metadata only
Date
2013-04-23Type
- Journal Article
Publication status
publishedExternal links
Journal / series
Chemistry of MaterialsVolume
Pages / Article No.
Publisher
American Chemical SocietySubject
Electron energy loss spectroscopy; Annular dark-field scanning; Transmission electron microscopy; In situ transmission electron; Microscopy; Atom probe tomography; Colloidal quantum dots; Semiconductor; Nanocrystals; Semiconductor nanowires; Dopant imaging; Impurity imaging; Solotronics; DopingOrganisational unit
03875 - Norris, David J. / Norris, David J.
Notes
Received 1 January 2013, Revised 4 March 2013, Published online 5 March 2013.More
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