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dc.contributor.author
Holmberg, Vincent C.
dc.contributor.author
Helps, Justin R.
dc.contributor.author
Mkhoyan, K. Andre
dc.contributor.author
Norris, David J.
dc.date.accessioned
2017-06-10T16:19:38Z
dc.date.available
2017-06-10T16:19:38Z
dc.date.issued
2013-04-23
dc.identifier.issn
0897-4756
dc.identifier.other
10.1021/cm400004x
dc.identifier.uri
http://hdl.handle.net/20.500.11850/66118
dc.language.iso
en
dc.publisher
American Chemical Society
dc.subject
Electron energy loss spectroscopy
dc.subject
Annular dark-field scanning
dc.subject
Transmission electron microscopy
dc.subject
In situ transmission electron
dc.subject
Microscopy
dc.subject
Atom probe tomography
dc.subject
Colloidal quantum dots
dc.subject
Semiconductor
dc.subject
Nanocrystals
dc.subject
Semiconductor nanowires
dc.subject
Dopant imaging
dc.subject
Impurity imaging
dc.subject
Solotronics
dc.subject
Doping
dc.title
Imaging impurities in semiconductor nanostructures
dc.type
Journal Article
ethz.journal.title
Chemistry of Materials
ethz.journal.volume
25
ethz.journal.issue
8
ethz.journal.abbreviated
Chem. Mater.
ethz.pages.start
1332
ethz.pages.end
1350
ethz.notes
Received 1 January 2013, Revised 4 March 2013, Published online 5 March 2013.
ethz.identifier.wos
ethz.identifier.nebis
000496041
ethz.publication.place
Washington, DC
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::02668 - Inst. f. Energie- und Verfahrenstechnik / Inst. Energy and Process Engineering::03875 - Norris, David J. / Norris, David J.
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::02668 - Inst. f. Energie- und Verfahrenstechnik / Inst. Energy and Process Engineering::03875 - Norris, David J. / Norris, David J.
ethz.date.deposited
2017-06-10T16:21:20Z
ethz.source
ECIT
ethz.identifier.importid
imp5936508a0e71440568
ethz.ecitpid
pub:105454
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-14T19:06:03Z
ethz.rosetta.lastUpdated
2022-03-28T11:40:38Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=Imaging%20impurities%20in%20semiconductor%20nanostructures&rft.jtitle=Chemistry%20of%20Materials&rft.date=2013-04-23&rft.volume=25&rft.issue=8&rft.spage=1332&rft.epage=1350&rft.issn=0897-4756&rft.au=Holmberg,%20Vincent%20C.&Helps,%20Justin%20R.&Mkhoyan,%20K.%20Andre&Norris,%20David%20J.&rft.genre=article&rft_id=info:doi/10.1021/cm400004x&
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