Surfactant controlled interface roughness and spin-dependent scattering in Cu/Co multilayers
dc.contributor.author
Amir, S. M.
dc.contributor.author
Gupta, M.
dc.contributor.author
Gupta, A.
dc.contributor.author
Stahn, J.
dc.date.accessioned
2017-06-10T17:26:15Z
dc.date.available
2017-06-10T17:26:15Z
dc.date.issued
2013-05
dc.identifier.issn
0947-8396
dc.identifier.issn
1432-0630
dc.identifier.other
10.1007/s00339-012-7527-9
dc.identifier.uri
http://hdl.handle.net/20.500.11850/67354
dc.language.iso
en
dc.publisher
Springer
dc.title
Surfactant controlled interface roughness and spin-dependent scattering in Cu/Co multilayers
dc.type
Journal Article
ethz.journal.title
Applied Physics A
ethz.journal.volume
111
ethz.journal.issue
2
ethz.journal.abbreviated
Appl. Phys. A
ethz.pages.start
495
ethz.pages.end
499
ethz.notes
Received 13 December 2012, Accepted 26 December 2012, Published online 22 January 2013.
ethz.identifier.wos
ethz.identifier.nebis
001385963
ethz.publication.place
Berlin
ethz.publication.status
published
ethz.date.deposited
2017-06-10T17:28:34Z
ethz.source
ECIT
ethz.identifier.importid
imp593650a3681e928142
ethz.ecitpid
pub:107263
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-14T18:30:49Z
ethz.rosetta.lastUpdated
2023-02-06T11:54:45Z
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