Erratum: "Modeling and simulation of tunneling through ultra-thin gate dielectrics" [J. Appl. Phys. 81, 7900 (1997)]
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Journal of Applied PhysicsVolume
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American Institute of PhysicsRelated publications and datasets
References: https://doi.org/10.1063/1.365364
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Erratum zu: J. Appl. Phys. 81, 7900 (1997). Received: 9 March 2007, Accepted: 2 April 2007, Published online: 1 May 2007.More
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