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dc.contributor.author
Menges, Fabian
dc.contributor.author
Riel, Heike
dc.contributor.author
Stemmer, Andreas
dc.contributor.author
Gotsmann, Bernd
dc.date.accessioned
2017-06-10T17:58:52Z
dc.date.available
2017-06-10T17:58:52Z
dc.date.issued
2013
dc.identifier.uri
http://hdl.handle.net/20.500.11850/67964
dc.language.iso
en
dc.publisher
Karlsruhe Institute of Technology (KIT)
dc.title
Quantifying Nanoscale Hot Spots by Scanning Thermal Microscopy
dc.type
Other Conference Item
ethz.event
4th International Workshop on Advanced Atomic Force Microscopy Techniques
ethz.event.location
Karlsruhe, Germany
ethz.event.date
March 4-5, 2013
ethz.notes
Conference lecture on 4 March 2013.
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03444 - Stemmer, Andreas / Stemmer, Andreas
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03444 - Stemmer, Andreas / Stemmer, Andreas
ethz.date.deposited
2017-06-10T17:59:30Z
ethz.source
ECIT
ethz.identifier.importid
imp593650af7c3e952781
ethz.ecitpid
pub:108047
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-15T00:38:34Z
ethz.rosetta.lastUpdated
2018-11-02T09:52:27Z
ethz.rosetta.versionExported
true
ethz.COinS
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