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dc.contributor.author
Menges, Fabian
dc.contributor.author
Riel, Heike
dc.contributor.author
Stemmer, Andreas
dc.contributor.author
Gotsmann, Bernd
dc.date.accessioned
2017-06-10T17:58:53Z
dc.date.available
2017-06-10T17:58:53Z
dc.date.issued
2012
dc.identifier.uri
http://hdl.handle.net/20.500.11850/67966
dc.language.iso
en
dc.publisher
Phonons & Fluctuations 3 Workshop
dc.title
Quantifying Nanoscale Hot Spots by Scanning Thermal Microscopy
dc.type
Conference Poster
ethz.event
Phonons & Fluctuations 3 Workshop
ethz.event.location
Sant Feliu de Guixols, Girona, Spain
ethz.event.date
May 21-24, 2012
ethz.notes
.
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02130 - Departement Maschinenbau und Verfahrenstechnik / Department of Mechanical and Process Engineering::03444 - Stemmer, Andreas
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02130 - Departement Maschinenbau und Verfahrenstechnik / Department of Mechanical and Process Engineering::03444 - Stemmer, Andreas
ethz.date.deposited
2017-06-10T17:59:30Z
ethz.source
ECIT
ethz.identifier.importid
imp593650af7fd6453633
ethz.ecitpid
pub:108049
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-14T23:20:41Z
ethz.rosetta.lastUpdated
2017-07-14T23:20:41Z
ethz.rosetta.versionExported
true
ethz.COinS
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