Frequency vs. amplitude modulation detection in ambient lift-mode Kelvin probe force microscopy
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Date
2010Type
- Other Conference Item
ETH Bibliography
yes
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Publication status
publishedPublisher
1st International Workshop on Advanced Atomic Force Microscopy TechniquesEvent
Organisational unit
03444 - Stemmer, Andreas / Stemmer, Andreas
Notes
Conference lecture 2 March 2010.More
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ETH Bibliography
yes
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