Frequency vs. amplitude modulation detection in ambient lift-mode Kelvin probe force microscopy

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Author
Ziegler, Dominik
Stemmer, Andreas
Date
2010
Type
    Other Conference Item
Publication status
published
Publisher
1st International Workshop on Advanced Atomic Force Microscopy Techniques
Event
1st International Workshop on Advanced Atomic Force Microscopy Techniques, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany, March 1-2, 2010
Organisational unit
03444 - Stemmer, Andreas / Stemmer, Andreas  
Notes
Conference lecture 2 March 2010.
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