Frequency vs. amplitude modulation detection in ambient lift-mode Kelvin probe force microscopy

Thumbnail
Metadata only
Author
Ziegler, Dominik
Stemmer, Andreas
Date
2010
Type
  • Other Conference Item
Publication status
published
External links
Search via SFX
Publisher
1st International Workshop on Advanced Atomic Force Microscopy Techniques
Event
1st International Workshop on Advanced Atomic Force Microscopy Techniques, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany, March 1-2, 2010
Organisational unit
03444 - Stemmer, Andreas  
Notes
Conference lecture 2 March 2010.
More
Show all metadata
ETH Bibliography
yes
Altmetrics