High frequency atomic force microscopy

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Author
Enning, Raoul
Date
2011
Type
    Doctoral Thesis
Rights / license
In Copyright - Non-Commercial Use Permitted
Permanent link
https://doi.org/10.3929/ethz-a-006707697
Publication status
published
External links
Search print copy at ETH Library
Contributors
Examiner: Stemmer, Andreas
Examiner: Duerig, Urs
Publisher
ETH Zurich
Subject
ATOMIC FORCE MICROSCOPES, AFM + ATOMIC FORCE MICROSCOPY; OPTOELEKTRONIK + PHOTOELEKTRONIK; HEURISTIC METHODS (OPERATIONS RESEARCH); HEURISTISCHE METHODEN (OPERATIONS RESEARCH); ELASTOMECHANIK; ELASTOMECHANICS; OPTOELECTRONICS + PHOTOELECTRONICS; RASTERKRAFTMIKROSKOPE, RKM + RASTERKRAFTMIKROSKOPIE
Organisational unit
03444 - Stemmer, Andreas (emeritus) / Stemmer, Andreas (emeritus)  
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