Focused ion beam (FIB) etching to investigate aluminium-coated polymer laminates subjected to heat and moisture loads
- Journal Article
Journal / seriesSurface & coatings technology
Pages / Article No.
SubjectScanning electron microscopy; Ion bombardment; Vacuum evaporation; Multilayer; Aluminium; Barrier envelopes
NotesReceived 11 February 2008, Accepted in revised form 10 July 2008, Published online 22 July 2008.
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