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dc.contributor.author
Tuma, Tomas
dc.contributor.author
Lygeros, John
dc.contributor.author
Sebastian, Abu
dc.contributor.author
Pantazi, Angeliki
dc.date.accessioned
2017-06-10T20:39:02Z
dc.date.available
2017-06-10T20:39:02Z
dc.date.issued
2013-08-08
dc.identifier.isbn
978-3-902823-31-1
dc.identifier.other
10.3182/20130410-3-CN-2034.00052
dc.identifier.uri
http://hdl.handle.net/20.500.11850/70981
dc.language.iso
en
dc.publisher
International Federation of Automatic Control (IFAC)
dc.title
Analysis and design of multiresolution scan trajectories for high-speed scanning probe microscopy
dc.type
Conference Paper
ethz.book.title
6th IFAC Symposium on Mechatronic Systems, MECH 2013
ethz.pages.start
138
ethz.pages.end
144
ethz.event
6th IFAC Symposium on Mechatronic Systems, MECH 2013
ethz.event.location
Hangzhou, China
ethz.event.date
April 10-12, 2013
ethz.notes
.
ethz.identifier.scopus
ethz.publication.place
Oxford
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02140 - Departement Informationstechnologie und Elektrotechnik / Department of Information Technology and Electrical Engineering::02650 - Institut für Automatik (IfA) / Automatic Control Laboratory (IfA)::03751 - Lygeros, John
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02140 - Departement Informationstechnologie und Elektrotechnik / Department of Information Technology and Electrical Engineering::02650 - Institut für Automatik (IfA) / Automatic Control Laboratory (IfA)::03751 - Lygeros, John
ethz.date.deposited
2017-06-10T20:41:03Z
ethz.source
ECIT
ethz.identifier.importid
imp593650ecb221e50577
ethz.ecitpid
pub:112429
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-13T13:28:18Z
ethz.rosetta.lastUpdated
2017-07-13T13:28:18Z
ethz.rosetta.versionExported
true
ethz.COinS
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