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dc.contributor.author
Kamer, Y.
dc.contributor.author
Ouillon, G.
dc.contributor.author
Sornette, Didier
dc.date.accessioned
2017-06-10T21:11:55Z
dc.date.available
2017-06-10T21:11:55Z
dc.date.issued
2013-08-29
dc.identifier.issn
1539-3755
dc.identifier.issn
1063-651X
dc.identifier.issn
1095-3787
dc.identifier.issn
1550-2376
dc.identifier.other
10.1103/PhysRevE.88.022922
dc.identifier.uri
http://hdl.handle.net/20.500.11850/71563
dc.language.iso
en
dc.publisher
American Physical Society
dc.title
Barycentric fixed-mass method for multifractal analysis
dc.type
Journal Article
ethz.journal.title
Physical Review E
ethz.journal.volume
88
ethz.journal.issue
2
ethz.journal.abbreviated
Phys. rev., E
ethz.pages.start
022922
ethz.size
9 p.
ethz.notes
Received 29 May 2013.
ethz.identifier.wos
ethz.identifier.nebis
004109079
ethz.publication.place
Ridge, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02120 - Dep. Management, Technologie und Ökon. / Dep. of Management, Technology, and Ec.::03738 - Sornette, Didier (emeritus) / Sornette, Didier (emeritus)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02120 - Dep. Management, Technologie und Ökon. / Dep. of Management, Technology, and Ec.::03738 - Sornette, Didier (emeritus) / Sornette, Didier (emeritus)
ethz.date.deposited
2017-06-10T21:13:36Z
ethz.source
ECIT
ethz.identifier.importid
imp593650fa254b417338
ethz.ecitpid
pub:113452
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-20T15:25:21Z
ethz.rosetta.lastUpdated
2020-02-14T12:25:22Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
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