Microscopic Origins of Catastrophic Optical Damage in Diode Lasers

Thumbnail
Metadata only
Author
Hempel, M.
Tomm, J. W.
La Mattina, F.
Ratschinski, I.
Schade, M.
Shorubalko, I.
Stiefel, M.
Leipner, H. S.
Kiessling, F. M.
Elsaesser, T.
Show all
Date
2013
Type
  • Journal Article
Publication status
published
External links
Search via SFX
Journal / series
IEEE Journal of Selected Topics in Quantum Electronics
Volume
19(4)
Publisher
IEEE
Subject
Semiconductor device measurements; Semiconductor diodes; Semiconductor lasers
Notes
.
More
Show all metadata
Citations
Cited 10 times in Web of Science
ETH Bibliography
yes
Altmetrics