Microscopic Origins of Catastrophic Optical Damage in Diode Lasers

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Author
Hempel, M.
Tomm, J. W.
La Mattina, F.
Ratschinski, I.
Schade, M.
Shorubalko, I.
Stiefel, M.
Leipner, H. S.
Kiessling, F. M.
Elsaesser, T.
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Date
2013
Type
  • Journal Article
Publication status
published
External links
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Journal / series
IEEE Journal of Selected Topics in Quantum Electronics
Volume
19(4)
Publisher
IEEE
Subject
Semiconductor device measurements; Semiconductor diodes; Semiconductor lasers
Notes
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Citations
Cited 11 times in Web of Science
ETH Bibliography
yes
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