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dc.contributor.author
VandeVondele, Joost
dc.date.accessioned
2017-06-10T21:49:59Z
dc.date.available
2017-06-10T21:49:59Z
dc.date.issued
2013
dc.identifier.uri
http://hdl.handle.net/20.500.11850/72255
dc.language.iso
en
dc.publisher
American Chemical Society
dc.title
Linear scaling DFT in CP2K
dc.type
Other Conference Item
ethz.journal.title
Abstracts of Papers of the American Chemical Society
ethz.journal.volume
245
ethz.pages.start
27-COMP
ethz.size
1 p.
ethz.event
245th National Meeting of the American-Chemical-Society (ACS)
ethz.event.location
New Orleans, LA, USA
ethz.event.date
April 7-11, 2013
ethz.identifier.wos
ethz.publication.place
Washington, DC
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02160 - Departement Materialwissenschaft / Department of Materials::03947 - VandeVondele, Joost (ehemalig)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02160 - Departement Materialwissenschaft / Department of Materials::03947 - VandeVondele, Joost (ehemalig)
ethz.date.deposited
2017-06-10T21:51:18Z
ethz.source
ECIT
ethz.identifier.importid
imp59365107e302644000
ethz.ecitpid
pub:114559
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-13T00:24:39Z
ethz.rosetta.lastUpdated
2018-09-01T03:55:28Z
ethz.rosetta.versionExported
true
ethz.COinS
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