Shunt-stub impedance matching circuit for time-resolved reflectometry charge detection in a quantum dot

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Author
Hellmüller, Sarah
Date
2013
Type
  • Doctoral Thesis
Rights / license
In Copyright - Non-Commercial Use Permitted
Permanent link
https://doi.org/10.3929/ethz-a-009980899
Publication status
published
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Contributors
Examiner: Ensslin, Klaus
Examiner: Schönenberger, Christian
Examiner: Ihn, Thomas
Publisher
ETH Zürich
Subject
EINZELELEKTRONENEFFEKTE (PHYSIK DER KONDENSIERTEN MATERIE); HALBLEITERMATERIALIEN (ELEKTROTECHNIK); NULLDIMENSIONALE STRUKTUR (PHYSIK DER KONDENSIERTEN MATERIE); MIKROWELLENTECHNIK (ELEKTROTECHNIK); NANOSTRUKTURIERTE MATERIALIEN (PHYSIK DER KONDENSIERTEN MATERIE); SEMICONDUCTOR MATERIALS (ELECTRICAL ENGINEERING); MICROWAVE ENGINEERING (ELECTRICAL ENGINEERING); ZERO-DIMENSIONAL STRUCTURE (CONDENSED MATTER PHYSICS); NANOSTRUCTURED MATERIALS (CONDENSED MATTER PHYSICS); SINGLE ELECTRON EFFECTS (CONDENSED MATTER PHYSICS)
Organisational unit
02010 - Dep. Physik / Dep. of Physics
03439 - Ensslin, Klaus / Ensslin, Klaus  
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