Shunt-stub impedance matching circuit for time-resolved reflectometry charge detection in a quantum dot

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Author
Date
2013Type
- Doctoral Thesis
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https://doi.org/10.3929/ethz-a-009980899Publication status
publishedExternal links
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Publisher
ETH ZürichSubject
EINZELELEKTRONENEFFEKTE (PHYSIK DER KONDENSIERTEN MATERIE); HALBLEITERMATERIALIEN (ELEKTROTECHNIK); NULLDIMENSIONALE STRUKTUR (PHYSIK DER KONDENSIERTEN MATERIE); MIKROWELLENTECHNIK (ELEKTROTECHNIK); NANOSTRUKTURIERTE MATERIALIEN (PHYSIK DER KONDENSIERTEN MATERIE); SEMICONDUCTOR MATERIALS (ELECTRICAL ENGINEERING); MICROWAVE ENGINEERING (ELECTRICAL ENGINEERING); ZERO-DIMENSIONAL STRUCTURE (CONDENSED MATTER PHYSICS); NANOSTRUCTURED MATERIALS (CONDENSED MATTER PHYSICS); SINGLE ELECTRON EFFECTS (CONDENSED MATTER PHYSICS)Organisational unit
02010 - Dep. Physik / Dep. of Physics03439 - Ensslin, Klaus / Ensslin, Klaus
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ETH Bibliography
yes
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