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dc.contributor.author
Rey, J.M.
dc.contributor.author
Kottman, J.
dc.contributor.author
Sigrist, M.W.
dc.date.accessioned
2017-06-10T22:58:58Z
dc.date.available
2017-06-10T22:58:58Z
dc.date.issued
2013-09
dc.identifier.issn
0946-2171
dc.identifier.issn
1432-0649
dc.identifier.issn
0721-7269
dc.identifier.issn
0340-3793
dc.identifier.other
10.1007/s00340-013-5437-y
dc.identifier.uri
http://hdl.handle.net/20.500.11850/73486
dc.language.iso
en
dc.publisher
Springer
dc.title
Photothermal diffuse reflectance: a new tool for spectroscopic investigation of scattering samples
dc.type
Journal Article
ethz.journal.title
Applied Physics B
ethz.journal.volume
112
ethz.journal.issue
4
ethz.journal.abbreviated
Appl. phys., B.
ethz.pages.start
547
ethz.pages.end
551
ethz.notes
.
ethz.identifier.wos
ethz.identifier.nebis
000935514
ethz.publication.place
Berlin
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02510 - Institut für Quantenelektronik / Institute for Quantum Electronics::03599 - Esslinger, Tilman / Esslinger, Tilman
ethz.leitzahl
08775 - Sigrist, Markus (Tit.-Prof.)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02510 - Institut für Quantenelektronik / Institute for Quantum Electronics::03599 - Esslinger, Tilman / Esslinger, Tilman
ethz.date.deposited
2017-06-10T23:02:16Z
ethz.source
ECIT
ethz.identifier.importid
imp5936511caeaa460597
ethz.ecitpid
pub:116406
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-24T09:35:58Z
ethz.rosetta.lastUpdated
2019-02-02T06:24:44Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
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