Time-of-flight diffraction with multiple frame overlap Part II

The strain scanner POLDI at PSI
Thumbnail
Metadata only
Author
Stuhr, U.
Spitzer, H.
Egger, J.
Hofer, A.
Rasmussen, P.
Graf, D.
Bollhalder, A.
Schild, M.
Bauer, G.
Wagner, W.
Show all
Date
2005-06
Type
  • Journal Article
Publication status
published
External links
Search via SFX
Journal / series
Nuclear Instruments & Methods in Physics Research. Section A
Volume
545(1-2)
Pages / Article No.
330 - 338
Publisher
North-Holland
Subject
Time-of-flight diffractometer; Residual stress; Strain scanner
Notes
Received 9 November 2004, Revised 21 January 2005, Accepted 21 January 2005.
More
Show all metadata
Citations
Cited 44 times in Web of Science
ETH Bibliography
yes
Altmetrics