Time-of-flight diffraction with multiple frame overlap Part II
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Author
Stuhr, U.
Spitzer, H.
Egger, J.
Hofer, A.
Rasmussen, P.
Graf, D.
Bollhalder, A.
Schild, M.
Bauer, G.
Wagner, W.
Date
2005-06Type
- Journal Article
Publication status
publishedJournal / series
Nuclear Instruments & Methods in Physics Research. Section AVolume
Pages
Publisher
North-HollandSubject
Time-of-flight diffractometer; Residual stress; Strain scannerNotes
Received 9 November 2004, Revised 21 January 2005, Accepted 21 January 2005.More
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