Time-of-flight diffraction with multiple frame overlap Part II

The strain scanner POLDI at PSI
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Author
Stuhr, U.
Spitzer, H.
Egger, J.
Hofer, A.
Rasmussen, P.
Graf, D.
Bollhalder, A.
Schild, M.
Bauer, G.
Wagner, W.
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Date
2005-06
Type
  • Journal Article
Publication status
published
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Journal / series
Nuclear Instruments & Methods in Physics Research. Section A
Volume
545(1-2)
Pages / Article No.
330 - 338
Publisher
North-Holland
Subject
Time-of-flight diffractometer; Residual stress; Strain scanner
Notes
Received 9 November 2004, Revised 21 January 2005, Accepted 21 January 2005.
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Citations
Cited 42 times in Web of Science
ETH Bibliography
yes
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