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dc.contributor.author
Stuhr, U.
dc.contributor.author
Spitzer, H.
dc.contributor.author
Egger, J.
dc.contributor.author
Hofer, A.
dc.contributor.author
Rasmussen, P.
dc.contributor.author
Graf, D.
dc.contributor.author
Bollhalder, A.
dc.contributor.author
Schild, M.
dc.contributor.author
Bauer, G.
dc.contributor.author
Wagner, W.
dc.date.accessioned
2017-06-10T23:42:44Z
dc.date.available
2017-06-10T23:42:44Z
dc.date.issued
2005-06
dc.identifier.issn
0168-9002
dc.identifier.issn
1872-9576
dc.identifier.other
10.1016/j.nima.2005.01.321
dc.identifier.uri
http://hdl.handle.net/20.500.11850/74260
dc.language.iso
en
dc.publisher
North-Holland
dc.subject
Time-of-flight diffractometer
dc.subject
Residual stress
dc.subject
Strain scanner
dc.title
Time-of-flight diffraction with multiple frame overlap Part II
dc.type
Journal Article
ethz.title.subtitle
The strain scanner POLDI at PSI
ethz.journal.title
Nuclear Instruments & Methods in Physics Research. Section A
ethz.journal.volume
545
ethz.journal.issue
1-2
ethz.journal.abbreviated
Nucl. instrum. methods phys. res., Sect. A, Accel. spectrom. detect. assoc. equip. (Print)
ethz.pages.start
330
ethz.pages.end
338
ethz.notes
Received 9 November 2004, Revised 21 January 2005, Accepted 21 January 2005.
ethz.identifier.nebis
007892163
ethz.publication.place
Amsterdam
ethz.publication.status
published
ethz.date.deposited
2017-06-10T23:45:52Z
ethz.source
ECIT
ethz.identifier.importid
imp5936512c6ee0882277
ethz.ecitpid
pub:117394
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T23:54:05Z
ethz.rosetta.lastUpdated
2018-08-02T12:55:43Z
ethz.rosetta.versionExported
true
ethz.COinS
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