Quantification of Deep Traps in Nanocrystal Solids, Their Electronic Properties, and Their Influence on Device Behavior

Thumbnail
Metadata only
Author
Bozyigit, Deniz
Volk, Sebastiancc
Yarema, Olesyacc
Wood, Vanessacc
Show all
Date
2013
Type
  • Journal Article
Publication status
published
External links
Search via SFX
Journal / series
Nano Letters
Volume
13(11)
Pages / Article No.
5284 - 5288
Publisher
American Chemical Society
Subject
Deep level transient spectroscopy (DLTS); Thermal admittance spectroscopy (TAS); Fourier transform photocurrent spectroscopy (FTPS); Quantum dots; PbS; Photovoltaics
Organisational unit
03895 - Wood, Vanessa / Wood, Vanessa  
Notes
Received 27 July 2013, Revised 18 October 2013, Published 28 October 2013.
More
Show all metadata
Citations
Cited 54 times in Web of Science
ETH Bibliography
yes
Altmetrics