Onset of vertical threading dislocations in Si1−xGex/Si (001) at a critical Ge concentration
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Datum
2013-11-18Typ
- Journal Article
ETH Bibliographie
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Abstract
We show that the Ge concentration in Si1−xGex alloys grown under strong out-of-equilibrium conditions determines the character of the population of threading dislocations (TDs). Above a critical value x ∼ 0.25 vertical TDs dominate over the common slanted ones. This is demonstrated by exploiting a statistically relevant analysis of TD orientation in micrometer-sized Si1−xGex crystals, deposited on deeply patterned Si(001) substrates. Experiments involving an abrupt change of composition in the middle of the crystals clarify the role of misfit-strain versus chemical composition in favoring the vertical orientation of TDs. A scheme invoking vacancy-mediated climb mechanism is proposed to rationalize the observed behavior. Mehr anzeigen
Persistenter Link
https://doi.org/10.3929/ethz-b-000076478Publikationsstatus
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Zeitschrift / Serie
APL MaterialsBand
Seiten / Artikelnummer
Verlag
American Institute of PhysicsOrganisationseinheit
03569 - Batlogg, Bertram (emeritus)
ETH Bibliographie
yes
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