PECVD of SıOx films from oxygen and hexamethyldisiloxane in a double source reactor
Open access
Author
Date
2006Type
- Doctoral Thesis
ETH Bibliography
yes
Altmetrics
Permanent link
https://doi.org/10.3929/ethz-a-005151598Publication status
publishedExternal links
Search print copy at ETH Library
Publisher
ETHSubject
SILICON OXIDES (INORGANIC CHEMISTRY); SILICIUMOXIDE (ANORGANISCHE CHEMIE); EIGENSCHAFTEN DÜNNER SCHICHTEN (PHYSIK VON MOLEKULARSYSTEMEN); CHEMICAL VAPOUR DEPOSITION, CVD (PRODUCTION ENGINEERING); PROPERTIES OF THIN LAYERS (PHYSICS OF MOLECULAR SYSTEMS); CHEMISCHE BESCHICHTUNGEN AUS DER GASPHASE, CVD (PRODUKTIONSTECHNIK)Organisational unit
03348 - Rudolf von Rohr, Philipp (emeritus) / Rudolf von Rohr, Philipp (emeritus)
More
Show all metadata
ETH Bibliography
yes
Altmetrics