A comparison between micro-Raman spectroscopy and SIMS of beveled surfaces for isotope depth profiling
Metadata only
Date
2013Type
- Journal Article
Publication status
publishedJournal / series
Solid State IonicsVolume
Pages / Article No.
Publisher
North-HollandSubject
SIMS; Raman; Isotope depth profiling; Oxygen ion conductorOrganisational unit
02513 - Laboratorium für Anorganische Chemie / Laboratory of Inorganic Chemistry03421 - Wokaun, Alexander (emeritus)
Notes
Received 23 January 2013, Received in revised form 27 September 2013, Accepted 27 September 2013, Available online 24 October 2013.More
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