A comparison between micro-Raman spectroscopy and SIMS of beveled surfaces for isotope depth profiling - Research Collection

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Author

Stender, Dieter

Heiroth, Sebastian

Lippert, Thomas

Wokaun, Alexander

Date

2013

Type

Journal Article

Citations

Cited 2 times in Web of Science

Cited 2 times in Scopus

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1016/j.ssi.2013.09.053

Journal / series

Solid state ionics

Volume

253

Pages / Article No.

185 - 188

Publisher

North-Holland

Subject

SIMS; Raman; Isotope depth profiling; Oxygen ion conductor

Organisational unit

02513 - Laboratorium für Anorganische Chemie / Laboratory of Inorganic Chemistry
03421 - Wokaun, Alexander (emeritus)

Notes

Received 23 January 2013, Received in revised form 27 September 2013, Accepted 27 September 2013, Available online 24 October 2013.

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Citations

Cited 2 times in Web of Science

Cited 2 times in Scopus

ETH Bibliography

yes

Altmetrics