A comparison between micro-Raman spectroscopy and SIMS of beveled surfaces for isotope depth profiling

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Author
Stender, Dieter
Heiroth, Sebastian
Lippert, Thomas
Wokaun, Alexander
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Date
2013
Type
  • Journal Article
Publication status
published
External links
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Journal / series
Solid state ionics
Volume
253
Pages
185 - 188
Publisher
North-Holland
Subject
SIMS; Raman; Isotope depth profiling; Oxygen ion conductor
Organisational unit
02513 - Laboratorium für Anorganische Chemie (LAC) / Laboratory of Inorganic Chemistry (LAC)
03421 - Wokaun, Alexander
Notes
Received 23 January 2013, Received in revised form 27 September 2013, Accepted 27 September 2013, Available online 24 October 2013.
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