A generalized modeling approach for the frequency shift in near-field scanning microwave microscopes

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Author
Niegemann, Jens
Date
2013
Type
  • Conference Paper
Publication status
published
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Journal / series
Electromagnetics in Advanced Applications (ICEAA)
Pages / Article No.
1145 - 1148
Publisher
IEEE
Event
15th International Conference on Electromagnetics in Advanced Applications 2013, Torino, Italy, September 9-13, 2013
Organisational unit
03472 - Professur für Feldtheorie (ehemalig)  
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