A generalized modeling approach for the frequency shift in near-field scanning microwave microscopes

Thumbnail
Metadata only
Author
Niegemann, Jens
Date
2013
Type
  • Conference Paper
Publication status
published
External links
Search via SFX
Journal / series
Electromagnetics in Advanced Applications (ICEAA)
Pages
1145 - 1148
Publisher
IEEE
Event
15th International Conference on Electromagnetics in Advanced Applications 2013, Torino, Italy, September 9-13, 2013
Organisational unit
03472 - Professur für Feldtheorie (ehemalig)
Notes
.
More
Show all metadata
Altmetrics