A generalized modeling approach for the frequency shift in near-field scanning microwave microscopes
dc.contributor.author
Niegemann, Jens
dc.date.accessioned
2017-06-11T03:00:53Z
dc.date.available
2017-06-11T03:00:53Z
dc.date.issued
2013
dc.identifier.isbn
978-146735707-4
dc.identifier.other
10.1109/ICEAA.2013.6632422
dc.identifier.uri
http://hdl.handle.net/20.500.11850/78094
dc.language.iso
en
dc.publisher
IEEE
dc.title
A generalized modeling approach for the frequency shift in near-field scanning microwave microscopes
dc.type
Conference Paper
ethz.journal.title
Electromagnetics in Advanced Applications (ICEAA)
ethz.pages.start
1145
ethz.pages.end
1148
ethz.event
15th International Conference on Electromagnetics in Advanced Applications 2013
ethz.event.location
Torino, Italy
ethz.event.date
September 9-13, 2013
ethz.identifier.scopus
ethz.publication.place
Piscataway N.J.
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02140 - Departement Informationstechnologie und Elektrotechnik / Department of Information Technology and Electrical Engineering::02635 - Institut für Elektromagnetische Felder (IEF) / Electromagnetic Fields Laboratory (IEF)::03472 - Professur für Feldtheorie (ehemalig)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02140 - Departement Informationstechnologie und Elektrotechnik / Department of Information Technology and Electrical Engineering::02635 - Institut für Elektromagnetische Felder (IEF) / Electromagnetic Fields Laboratory (IEF)::03472 - Professur für Feldtheorie (ehemalig)
ethz.date.deposited
2017-06-11T03:03:25Z
ethz.source
ECIT
ethz.identifier.importid
imp59365175b195730052
ethz.ecitpid
pub:123020
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T21:01:16Z
ethz.rosetta.lastUpdated
2018-01-09T11:23:33Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=A%20generalized%20modeling%20approach%20for%20the%20frequency%20shift%20in%20near-field%20scanning%20microwave%20microscopes&rft.jtitle=Electromagnetics%20in%20Advanced%20Applications%20(ICEAA)&rft.date=2013&rft.spage=1145&rft.epage=1148&rft.au=Niegemann,%20Jens&rft.isbn=978-146735707-4&rft.genre=proceeding&rft_id=info:doi/10.1109/ICEAA.2013.6632422&
Files in this item
| Files | Size | Format | Open in viewer |
|---|---|---|---|
|
There are no files associated with this item. |
|||
Publication type
-
Conference Paper [33039]