Scanning X-ray strain microscopy of inhomogeneously strained Ge micro-bridges

Download
Full text (published version) (PDF, 1.299Mb)
Thumbnail
Open access
ccby
Author
Etzelstorfer, Tanja
Süess, Martin J.
Schiefler, Gustav L.
Jacques, Vincent L.R.
Carbone, Dina
Chrastina, Daniel
Isella, Giovanni
Spolenak, Ralph
Stangl, Julian
Sigg, Hans
Diaz, Ana
Show all
Date
2014
Type
    Journal Article
Rights / license
Creative Commons Attribution 4.0 International
Permanent link
https://doi.org/10.3929/ethz-b-000078262
Publication status
published
External links
Journal / series
Journal of Synchrotron Radiation
Volume
21(1)
Pages / Article No.
111 - 118
Publisher
Wiley-Blackwell
Subject
X-ray diffraction; local probe X-ray diffraction; strain
Organisational unit
03692 - Spolenak, Ralph / Spolenak, Ralph  
More
Show all metadata
Citations
Cited 37 times in Scopus
ETH Bibliography
yes
Altmetrics