SCC thermal model identification via advanced bias-compensated least-squares
dc.contributor.author
Diversi, Roberto
dc.contributor.author
Bartolini, Andrea
dc.contributor.author
Tilli, Andrea
dc.contributor.author
Beneventi, Francesco
dc.contributor.author
Benini, Luca
dc.date.accessioned
2017-06-11T03:35:00Z
dc.date.available
2017-06-11T03:35:00Z
dc.date.issued
2013
dc.identifier.isbn
978-1-4673-5071-6
dc.identifier.isbn
978-3-9815370-0-0
dc.identifier.other
10.7873/DATE.2013.060
dc.identifier.uri
http://hdl.handle.net/20.500.11850/78759
dc.language.iso
en
dc.publisher
IEEE
dc.title
SCC thermal model identification via advanced bias-compensated least-squares
dc.type
Conference Paper
ethz.book.title
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE) : proceedings
ethz.pages.start
230
ethz.pages.end
235
ethz.event
Design, Automation & Test in Europe
ethz.event.location
Grenoble, France
ethz.event.date
March 18-22, 2013
ethz.publication.place
Piscataway, NJ
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03996 - Benini, Luca / Benini, Luca
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02636 - Institut für Integrierte Systeme / Integrated Systems Laboratory::03996 - Benini, Luca / Benini, Luca
ethz.date.deposited
2017-06-11T03:38:07Z
ethz.source
ECIT
ethz.identifier.importid
imp59365181d627798639
ethz.ecitpid
pub:123834
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-15T05:18:26Z
ethz.rosetta.lastUpdated
2024-02-01T21:26:29Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=SCC%20thermal%20model%20identification%20via%20advanced%20bias-compensated%20least-squares&rft.date=2013&rft.spage=230&rft.epage=235&rft.au=Diversi,%20Roberto&Bartolini,%20Andrea&Tilli,%20Andrea&Beneventi,%20Francesco&Benini,%20Luca&rft.isbn=978-1-4673-5071-6&978-3-9815370-0-0&rft.genre=proceeding&rft_id=info:doi/10.7873/DATE.2013.060&rft.btitle=2013%20Design,%20Automation%20&%20Test%20in%20Europe%20Conference%20&%20Exhibition%20(DATE)%20:%20proceedings
Files in this item
| Files | Size | Format | Open in viewer |
|---|---|---|---|
|
There are no files associated with this item. |
|||
Publication type
-
Conference Paper [36764]