Defect Analysis with TCAD-Based DLTS Simulation

Metadata only

Author

Scheinemann, A.

Schenk, A.

Date

2013

Type

Altmetrics

Publication status

published

External links

Editor

Mori, Nobuya

Selberherr, Siegfried

Book title

16th International Workshop on Computational Electronics : Book of Abstracts : June 4-7, 2013 : Nara, Japan

Pages

130 - 131

Publisher

Society for Micro- and Nanoelectronics

Event

16th International Workshop on Computational Electronics (IWCE 2013), Nara, Japan, June 4-7, 2013

Organisational unit

03925 - Luisier, Mathieu

Notes

.

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Research Collection