Defect Analysis with TCAD-Based DLTS Simulation

Metadata only

Author

Date

2013

Type

Other Conference Item

ETH Bibliography

yes

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Publication status

published

Editor

Book title

16th International Workshop on Computational Electronics : Book of Abstracts : June 4-7, 2013 : Nara, Japan

Pages / Article No.

130 - 131

Publisher

Society for Micro- and Nanoelectronics

Event

16th International Workshop on Computational Electronics (IWCE 2013), Nara, Japan, June 4-7, 2013

Organisational unit

03925 - Luisier, Mathieu / Luisier, Mathieu

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ETH Bibliography

yes

Altmetrics

Research Collection