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dc.contributor.author
Zanin, D.A.
dc.contributor.author
De Pietro, L.G.
dc.contributor.author
Cabrera, H.
dc.contributor.author
Thalmann, P.
dc.contributor.author
Redmann, A.-L.
dc.contributor.author
Ramsperger, U.
dc.contributor.author
Pescia, D.
dc.contributor.author
Erbudak, M.
dc.date.accessioned
2017-06-11T03:50:43Z
dc.date.available
2017-06-11T03:50:43Z
dc.date.issued
2013-03
dc.identifier.issn
0003-0503
dc.identifier.uri
http://hdl.handle.net/20.500.11850/79121
dc.language.iso
en
dc.publisher
American Physical Society
dc.title
Near Field-Emission Scanning Electron Microscopy with Energy Analysis
dc.type
Other Conference Item
ethz.journal.title
Bulletin of the American Physical Society
ethz.journal.volume
58
ethz.journal.issue
1
ethz.journal.abbreviated
Bull. Am. Phys. Soc.
ethz.event
APS March Meeting 2013
ethz.event.location
Baltimore, MD, USA
ethz.event.date
March 18-22, 2013
ethz.notes
.
ethz.identifier.nebis
000006053
ethz.publication.place
Melville, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02010 - Departement Physik / Department of Physics::02505 - Laboratorium für Festkörperphysik (LFP) / Laboratory for Solid State Physics (LFP)::03351 - Pescia, Danilo
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02010 - Departement Physik / Department of Physics::02505 - Laboratorium für Festkörperphysik (LFP) / Laboratory for Solid State Physics (LFP)::03351 - Pescia, Danilo
ethz.date.deposited
2017-06-11T03:51:51Z
ethz.source
ECIT
ethz.identifier.importid
imp59365187eea2b72141
ethz.ecitpid
pub:124397
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T19:04:38Z
ethz.rosetta.lastUpdated
2017-07-12T19:04:38Z
ethz.rosetta.versionExported
true
ethz.COinS
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