Universal method for extracting transport parameters from Monte Carlo device simulation
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Date
2007Type
- Journal Article
ETH Bibliography
yes
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Publication status
publishedExternal links
Journal / series
IEEE Transactions on Electron DevicesVolume
Pages / Article No.
Publisher
IEEESubject
Boltzmann equation; device simulation; generalized drift-diffusion equation; inverse scattering operator; transport parametersOrganisational unit
03228 - Fichtner, Wolfgang
Notes
Date Published in Issue: 2007-10-29. Manuscript received January 19, 2007, Revised July 3, 2007.More
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ETH Bibliography
yes
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