Show simple item record

dc.contributor.author
Castellazzi, Alberto
dc.contributor.author
Ciappa, Mauro
dc.date.accessioned
2017-06-08T17:59:18Z
dc.date.available
2017-06-08T17:59:18Z
dc.date.issued
2007
dc.identifier.issn
1530-4388
dc.identifier.issn
1558-2574
dc.identifier.other
10.1109/TDMR.2007.910439
dc.identifier.uri
http://hdl.handle.net/20.500.11850/7957
dc.language.iso
en
dc.publisher
IEEE
dc.subject
Avalanche-breakdown
dc.subject
electrothermal effects
dc.subject
powerMOSFETs
dc.subject
reliability
dc.subject
short-circuit
dc.subject
thermal instability
dc.title
Electrothermal characterization for reliability of modern low-voltage powerMOSFETs
dc.type
Journal Article
ethz.journal.title
IEEE Transactions on Device and Materials Reliability
ethz.journal.volume
7
ethz.journal.issue
4
ethz.journal.abbreviated
IEEE trans. device mater. reliab.
ethz.pages.start
571
ethz.pages.end
580
ethz.identifier.nebis
004200853
ethz.publication.place
Piscataway, NJ
ethz.publication.status
published
ethz.leitzahl
03228 - Fichtner, Wolfgang
ethz.leitzahl.certified
03228 - Fichtner, Wolfgang
ethz.date.deposited
2017-06-08T17:59:33Z
ethz.source
ECIT
ethz.identifier.importid
imp59364bbda6a3c15353
ethz.ecitpid
pub:18595
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-08-01T10:06:43Z
ethz.rosetta.lastUpdated
2018-08-02T04:09:42Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=Electrothermal%20characterization%20for%20reliability%20of%20modern%20low-voltage%20powerMOSFETs&rft.jtitle=IEEE%20Transactions%20on%20Device%20and%20Materials%20Reliability&rft.date=2007&rft.volume=7&rft.issue=4&rft.spage=571&rft.epage=580&rft.issn=1530-4388&1558-2574&rft.au=Castellazzi,%20Alberto&Ciappa,%20Mauro&rft.genre=article&
 Search via SFX

Files in this item

FilesSizeFormatOpen in viewer

There are no files associated with this item.

Publication type

Show simple item record